★★★★★★★★★★★★★★★★★★★★★★★★★★★★★★★★★★★★★★★★★★★★★★★★★★Open research. Global perspectives.
Engineering and Technology OPEN ACCESS

AI-Guided Stimulus and Debug Triage: A Methodology for Accelerating Pre-Silicon Emulation of Flagship SoC Programs

Abhishek Kumar Sinha
Independent Researcher
tajet 2026
VOL. 8 / NO. 10 OCTOBER
VOLUME 8
ISSUE 10
YEAR 2026
PAGES 1-7

Abstract

Raw emulation capacity for flagship system-on-chip (SoC) programs keeps growing, and engineer-hour supply keeps falling further behind it. That gap, not machine availability, is the actual bottleneck in pre-silicon verification today, driven by workload diversity across artificial intelligence (AI), extended reality (XR), and mobile platforms converging on a single die. This article argues that closing the gap requires a bounded, governed layer of AI-guided assistance rather than either extreme - full automation or continued reliance on engineer-only throughput. A three-layer adoption framework is proposed: scoping, which restricts AI involvement to stimulus generation for known-workload classes and anomaly-flagged debug triage while keeping root-cause sign-off and tape-out risk calls fully engineer-owned; validation, which requires every AI-generated output to be checked against a trusted reference  -  simulation, formal methods, or historical regression baselines  -  before an engineer may act on it; and governance, an operating-review cadence with rollback criteria defined before deployment, not improvised afterward. Pilot deployment of emulation-friendly RTL on a premium-tier mobile SoC program produced a shift of approximately 60 percent of RTL earlier in the program schedule, with no coverage-model exception granted to reach that outcome. The finding that emerges is not that AI accelerates verification - that much is already argued elsewhere - but that the acceleration only survives contact with a tape-out schedule when it is deliberately bounded. Emulation productivity under AI assistance is a governance problem before it is a technical one, and the three-layer framework is offered as a transferable operating model for programs where the cost of an unvalidated miss is unacceptable.

Keywords

Artificial Intelligence SoC Emulation RTL Verification Stimulus Generation

Downloads

Download data is not yet available.

References

  1. S. Fine, A. Freund, I. Jaeger, Y. Naveh, A. Ziv, Y. Mansour, "Harnessing Machine Learning to Improve the Success Rate of Stimuli Generation," IEEE HLDVT, 2005. https://ieeexplore.ieee.org/document/1568823
  2. L. Pierre, F. Pancher, R. Suescun, J. Quévremont, "On the Effectiveness of Assertion-Based Verification in an Industrial Context," FMICS, LNCS vol. 8187, pp. 78-93, 2013. https://link.springer.com/chapter/10.1007/978-3-642-41010-9_6
  3. Accellera Systems Initiative, Portable Test and Stimulus Standard, Version 1.0a, 2019. https://accellera.org/images/downloads/standards/pss/Portable_Test_Stimulus_Standard_v2.1.pdf
  4. IEEE, IEEE Standard for SystemVerilog, IEEE Std 1800-2017, 2018. https://ieeexplore.ieee.org/document/8299595
  5. Accellera Systems Initiative, Universal Verification Methodology (UVM) 1.2 User's Guide, 2015. https://www.accellera.org/downloads/standards/uvm
  6. G. Huang et al., "Machine Learning for Electronic Design Automation: A Survey," ACM TODAES, vol. 26, no. 5, art. 40, 2021. https://arxiv.org/abs/2102.03357
  7. M. Liu, N. Pinckney, B. Khailany, H. Ren, "VerilogEval: Evaluating Large Language Models for Verilog Code Generation," IEEE/ACM ICCAD, 2023. https://arxiv.org/abs/2309.07544
  8. N. Pinckney, C. Batten, M. Liu, H. Ren, B. Khailany, "Revisiting VerilogEval," ACM TODAES, vol. 30, no. 6, art. 91, 2025. https://arxiv.org/abs/2408.11053
  9. H. Liu, Y. Lu, M. Wang, X. Yao, B. Yu, "LLM-Assisted Circuit Verification: A Comprehensive Survey," ASP-DAC, 2026. https://ieeexplore.ieee.org/document/11420692
  10. D. N. Gadde, T. Nalapat, A. Kumar, S. Simon, D. Lettnin, W. Kunz, "Efficient Stimuli Generation using Reinforcement Learning in Design Verification," SMACD, 2024. https://arxiv.org/abs/2405.19815
  11. Z. Yan, W. Fang, M. Li, M. Li, S. Liu, Z. Xie, H. Zhang, "AssertLLM," ASP-DAC, 2025. https://zhiyaoxie.com/files/ASPDAC25_AssertLLM.pdf
  12. R. Qiu, G. L. Zhang, R. Drechsler, U. Schlichtmann, B. Li, "AutoBench," ACM/IEEE MLCAD, 2024. https://portal.fis.tum.de/en/publications/autobench-automatic-testbench-generation-and-evaluation-using-llm/
  13. J. Ye et al., "From Concept to Practice: an Automated LLM-aided UVM Machine for RTL Verification," IEEE/ACM ICCAD, 2025. https://arxiv.org/abs/2504.19959
  14. K. Xu, J. Sun, Y. Hu, X. Fang, W. Shan, X. Wang, Z. Jiang, "MEIC: Re-thinking RTL Debug Automation using LLMs," IEEE/ACM ICCAD, 2024. https://arxiv.org/abs/2405.06840
  15. S. Liu, Y. Lu, W. Fang, M. Li, Z. Xie, "OpenLLM-RTL," IEEE/ACM ICCAD, 2024. https://arxiv.org/abs/2503.15112
  16. R. Gal, E. Haber, A. Ziv, "Using DNNs and Smart Sampling for Coverage Closure Acceleration," ACM/IEEE MLCAD, 2020. https://ieeexplore.ieee.org/document/9394648
  17. A. Jayasena, P. Mishra, "Directed Test Generation for Hardware Validation: A Survey," ACM Computing Surveys, 2023. https://dl.acm.org/doi/10.1145/3638046
  18. L. Zulberti, S. Di Matteo, P. Nannipieri, S. Saponara, L. Fanucci, "A Script-Based Cycle-True Verification Framework to Speed-Up Hardware and Software Co-Design," Electronics, vol. 11, no. 22, art. 3704, 2022. https://www.mdpi.com/2079-9292/11/22/3704
  19. M. Abdollahi, S. F. Yeganli, M. A. Baharloo, A. Baniasadi, "Hardware Design and Verification with Large Language Models: A Scoping Review," Electronics, vol. 14, no. 1, art. 120, 2025. https://www.mdpi.com/2079-9292/14/1/120
  20. A. Rammal, K. Ezukwoke, A. Hoayek, M. Batton-Hubert, "Root Cause Prediction for Failures in Semiconductor Industry," Scientific Reports, vol. 13, art. 4934, 2023. https://www.nature.com/articles/s41598-023-30769-8
  21. S. Alsaedi, A. A. A. Gad-Elrab, A. Noaman, F. Eassa, "Two-Level Information-Retrieval-Based Model for Bug Localization," Electronics, vol. 13, no. 2, art. 321, 2024. https://www.mdpi.com/2079-9292/13/2/321
  22. A. Newcomb, O. Ochoa, "Formal Methods for Safety-Critical Machine Learning: A Systematic Literature Review," Frontiers in AI, vol. 9, art. 1749956, 2026. https://www.frontiersin.org/journals/artificial-intelligence/articles/10.3389/frai.2026.1749956/full